Holographic Grating for Scanning Electron Microscopy, Atomic Force Microscopy, Auger and Focused Ion Beam

Precision, holographic patterns, provide accurate calibration and feature high stability and usability. Moderate ridge heights are convenient for AFM. Specimens provide good contrast for secondary and backscatter imaging with SEM. They enable accurate calibration for high resolution, nanometer-scale measurements.

Available with 145 and 292nm pitch.

1µm AFM Scan 145nm Pitc

292nm Pitch