Conductive AFM probes |
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 The AFM tip is micromachined, monolithic Silicon probe, exhibiting excellent uniformity and a sharp tip radius. The consistent tip radius of less than 10 nm gives good resolution and reproducibility. This probe uses an "on scan angle" symmetric tip to provide a more symmetric representation of features over 200 nm |
 The AFM cantilever is micromachined, monolithic Silicon, exhibiting excellent uniformity. It provides high quality imaging for all standard atomic force microscopes (AFMs). |
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 The AFM Holder Chip fits most commercial AFMs as it is industry standard size. It is compatible with DI/Veeco AFMs, TM Microscopes, JEOL, Molecular Imaging, and other commercial atomic force microscopes (AFMs). This product features alignment grooves on the backside of the holder chip. |
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