NIST traceable* with features from 2mm to 1µm for magnification 10x-20,000x, ideal for desktop SEM.
*Uses average data measured for each production wafer.
Feature sizes: 2mm, 1mm, 0.5mm, 0.1mm, 50µm, 10µm, 5µm, 2µm, and 1µm
PELCO CDMS-XY-1T, Etched Si
Price range: € 0,00 through € 260,80
2mm-1µm, Traceble
Additional information
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