145nm Pitch Calibration Standard for AFM
Precision holographic pattern for accurate calibration for high resolution, nanometer scale measurements.
| Period: | 145nm pitch nominal, one dimensional array. Accuracy is +/- 1nm. Calibration certificate will give the actual pitch of the standard. |
| Surface structure: | Aluminum lines on glass, 4x6mm dimensions. Line height (about 100nm) and line width (about 75nm) are not calibrated. |
| Usability: | The calibrated pattern covers the entire standard. There is sufficient usable area to make tens of thousands of measurements without reusing any areas contaminated or altered by previous scans. |
| AFM: | Use in contact, tapping and other modes with image sizes from 250nm to 10um. Available unmounted or mounted on a 12mm steel AFM disk. |
| Certification: | Comes with a non-traceable manufacturer’s certificate stating average pitch, based on batch measurements. |
