Traceable at the wafer level to a NIST standard (ISO 17025:2017 Sampling Scope of Accreditation) with features from 2mm to 1µm for magnification 10x-20,000x, ideal for desktop SEM.
Feature sizes: 2mm, 1mm, 0.5mm, 0.1mm, 50µm, 10µm, 5µm, 2µm, and 1µm
Pelcotec CDMS-XY-1T-ISO, Etched Si
Price range: € 0,00 through € 580,60
2mm – 1µm, Traceable
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