Description

Pro Series of Image Analysis Standard (Reference Stage Graticule)

Provides 4, high precision test areas designed for calibrating image analysis systems and identifying deviations and distortions in optical imaging systems.
The standard, which can also be used as a high precision stage micrometer, is supplied with recommendations for its use and an individual certificate of calibration.

It is produced on a 75mm x 25mm slide and has a square grid accuracy of 0.1 m and a dot accuracy of 0.3 m (except for the smallest and largest two dots on the root-2 array where accuracy is 0.5 m).

The four test areas are:

A 400 m x 400 m square grid which is subdivided into 200, 100, 50 and 25 m squares provides a means so detecting gross image distortions and can be used as an accurate two dimensional stage micrometer.

A 20 x 17 array of nominally 15 m diameter dots can be used to identify lens distortions. i.e. to set the field of view to eliminate edge distortion.
A root-2 array of spots from 3 m to 48 m diameter is used for determining the threshold level of cameras and microscope systems.
A log-nominal distribution array of 100 spots ranging from 4.5 m to 27 m diameter enables the mean and standard deviation to be determined and compared with the certified values. This is an idealized distribution of maximum dynamic range for a full screen.

Supplied with a Certificate of Calibration from NPL (National Physics Laboratory, counterpart of NIST in the UK.).

Note: NPL is part of the International Metrology Group so that all of its measurements are directly traceable to the International Metre Standard held in Paris, France.
This means that the certificate is internationally traceable.